1. Dilworth IP Symposium – Intellectual Property Fundamentals: What Everyone in R&D Must Know – Just Two Weeks Away!

    Posted on 08.10.13 Michael Dilworth, on Announcements, News and Events

    Dilworth IP’s half-day symposium at NERM 2013 is just two weeks away! The Firm has been invited to organize the event for the Northeast Regional Meeting (NERM) of the American Chemical Society at the Omni Hotel in New Haven on October 23rd. We are very excited to be a part of this large gathering of scientists and engineers.

    Our speakers, accomplished IP practitioners with diverse experience and backgrounds including industry, academia, and private practice, will be presenting eight short talks on Intellectual Property Fundamentals: What Everyone in R&D Must Know. These talks include such topics as How to Read a Patent, Aligning Your IP Strategy with Your Business Strategy, and Copyright Issues to Consider When Publishing. The symposium will be a great source of practical IP knowledge for business managers, scientists, or anyone involved in research and development.

    Read Full
  2. Dilworth IP to Host IP Symposium

    Posted on 05.09.13 Michael Dilworth, on Announcements, News and Events

    Dilworth IP will host a half-day symposium on intellectual property law at the Northeast Regional Meeting (NERM) of the American Chemical Society at the Omni Hotel in New Haven, CT on October 23, 2013. Intellectual Property Fundamentals: What Everyone in R&D Must Know will feature short presentations designed to give scientists, engineers, business managers, and other R&D professionals practical knowledge on key aspects of IP law.

    Read Full
  3. Welcome to the New Dilworth IP Site

    Posted on 02.03.12 Michael Dilworth, on Announcements

    Welcome! We are excited to announce the launch of our new website and the new look of Dilworth IP. Please explore the site freely. We encourage you to pay particular attention to the bio pages of the talented individuals who provide world-class IP services to our clients.

    Read Full